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dc.contributorSubedi, Sushilen_US
dc.contributorDuveiller, Etienneen_US
dc.contributorSharma, Ramen_US
dc.creatorRosyara, Umesh R.en_US
dc.date2010-12-01en_US
dc.date.accessioned2020-11-20T22:49:09Z
dc.date.available2020-11-20T22:49:09Z
dc.identifierhttps://mel.cgiar.org/dspace/limiteden_US
dc.identifier.citationUmesh R. Rosyara, Sushil Subedi, Etienne Duveiller, Ram Sharma. (1/12/2010). Photochemical Efficiency and SPAD Value as Indirect Selection Criteria for Combined Selection of Spot Blotch and Terminal Heat Stress in Wheat. Journal of Phytopathology, 158 (11-12), pp. 813-821.en_US
dc.identifier.urihttps://hdl.handle.net/20.500.11766/12080
dc.description.abstractTerminal heat and spot blotch caused by Cochliobolus sativus are important stresses causing significant wheat (Triticum aestivum L.) yield losses in the south Asian plains. Recent studies have shown that chlorophyll-related traits are correlated with heat stress and spot blotch resistance in wheat. This study was conducted to evaluate leaf photochemical efficiency and leaf greenness (measured as SPAD value) for combined selection of spot blotch and terminal heat stress. The efficiency of photosystem II was measured as ratio of variable to maximal chlorophyll fluorescence, F-v/F-m, using chlorophyll fluorometer build on pulse modulation principle. The study was conducted in three spring wheat populations derived by crossing spot blotch-resistant wheat genotypes 'Milan/Shanghai#7', 'Chirya.3' and 'NL971' with a susceptible cultivar 'BL 1473'. The F-3 and F-4 generations were grown under natural epiphytotics of spot blotch either in optimal or in terminal heat stress conditions at Rampur, Nepal. The heritability (h(2)) of F-v/F-m, SPAD measurements and their genetic correlation with 1000-kernel weight (TKW) and area under disease progress curve (AUDPC) were estimated. The h(2) estimates for F-v/F-m and SPAD measurements were moderate to high. In addition, AUDPC and TKW showed low to high genetic correlation with these traits. These findings suggest that F-v/F-m and SPAD measurements could be used as complementary traits in selecting for spot blotch resistance and heat tolerance in wheat.en_US
dc.formatPDFen_US
dc.languageenen_US
dc.publisherWileyen_US
dc.rightsCopyrighted; all rights reserveden_US
dc.sourceJournal of Phytopathology;158,(2010) Pagination 813,821en_US
dc.subjectfoliar blighten_US
dc.subjectratio of variable to maximal fluorescence (f-v/f-m)en_US
dc.subjectleaf greenness (spad value)en_US
dc.subjecthelminthosporium leaf blighten_US
dc.subjectWheaten_US
dc.titlePhotochemical Efficiency and SPAD Value as Indirect Selection Criteria for Combined Selection of Spot Blotch and Terminal Heat Stress in Wheaten_US
dc.typeJournal Articleen_US
cg.creator.idSharma, Ram: 0000-0002-7785-363Xen_US
cg.creator.ID-typeORCIDen_US
cg.subject.agrovoccochliobolus sativusen_US
cg.subject.agrovocbipolaris sorokinianaen_US
cg.contributor.centerInstitute of Agriculture and Animal Science - IAASen_US
cg.contributor.centerSouth Dakota State Universityen_US
cg.contributor.centerInternational Maize and Wheat Improvement Center - CIMMYTen_US
cg.contributor.centerInternational Center for Agricultural Research in the Dry Areas - ICARDAen_US
cg.contributor.funderInternational Foundation for Science - IFSen_US
cg.contributor.projectCommunication and Documentation Information Services (CODIS)en_US
cg.contributor.project-lead-instituteInternational Center for Agricultural Research in the Dry Areas - ICARDAen_US
cg.date.embargo-end-dateTimelessen_US
cg.coverage.regionGlobalen_US
cg.contactumesh.rosyara@sdstate.eduen_US
cg.identifier.doihttps://dx.doi.org/10.1111/j.1439-0434.2010.01703.xen_US
dc.identifier.statusTimeless limited accessen_US
mel.impact-factor1.179en_US


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