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Investigating root system architectural traits in durum wheat to improve adaptation to drought and crown rot conditions
Durum wheat (Triticum turgidum L. ssp. durum) producers can experience significant yield and grain losses due to crown rot (CR) disease, caused primarily by a fungal pathogen Fusarium pseudograminearum. Losses due to CR ...
Yield of chromosomally engineered durum wheat-Thinopyrum ponticum recombinant lines in a range of contrasting rain-fed environments
Introgressions of Thinopyrum ponticum 7AgL chromosome segments, spanning 23%, 28% and 40% of the distal end of durum wheat 7AL arm, were previously shown to contain multiple beneficial gene(s)/QTL for yield-related traits, ...