Distribution of Sunn Pest, Eurygaster integriceps Puton (Hemiptera: Scutelleridae), in overwintering sites

Bruce L. Parker, Masood Amir Mafi, Margaret Skinner, Mustapha El Bouhssini, Jae Su Kim. (1/3/2011). Distribution of Sunn Pest, Eurygaster integriceps Puton (Hemiptera: Scutelleridae), in overwintering sites. Journal of Asia-Pacific Entomology, 14 (1), pp. 83-88.

Abstract

Sunn Pest, Eurygaster integriceps Puton (Hemiptera: Scutelleridae), is the most serious pest of wheat in West and Central Asia. Following harvest, the pest migrates from wheat fields to high elevations to escape high summer temperatures and, the following spring, moves back to the fields. In this work, Sunn Pest populations were monitored in 21 overwintering sites located in seven provinces (with 800-2500 m elevation) in Iran. Litter samples were taken twice in each site, once in July-November 2002 and again in March 2003. At each site 60 Artemesia sp. bushes were selected at random and litter from each bush was collected and the number of live male and female adult Sunn Pest counted. More Sunn Pests were collected in higher elevations in the first sampling. Golestan (893 m), Kermanshah (1583 m), and Qazvin (1675 m), located in valleys and surrounded by mountainous areas, had <5 adults/bush. However Azarbayejan (1750 m), Markazi (1883 m), Kordestan (2067 m), and Esfahan (2141 m), located in mountainous areas and/or close to mountains, had 10-52 adults/bush. No noticeable changes in Sunn Pest populations were observed in 17 overwintering sites among 21 between the two sampling times. These results suggest that, after Sunn Pest moves to more highly elevated sites at aestivation time, most of them remain in these sites during overwintering before migration to wheat fields in the spring. Sunn Pest can be targeted for management in these areas during the fall and/or early spring as their movement is clearly limited. (C) Korean Society of Applied Entomology, Taiwan Entomological Society and Malaysian Plant Protection Society, 2010. Published by Elsevier B.V. All rights reserved.